HT-T1™
HT-T1™: The Advanced Solution for Transparent Structure Analysis
Unveiling the Invisible. Defining the Future.
Holotomography is an advanced optical imaging technique that captures refractive index distributions from multiple angles to provide high-resolution 3D structural analysis. Designed for transparent materials, the HT-T1™ is a transmission-based holotomography system optimized for non-destructive inspection of glass substrates, waveguides, and other optically transparent samples.
By utilizing Tomocube’s second-generation holotomography technology, the HT-T1™ enables high-resolution, noise-free imaging without the limitations of conventional optical metrology. With a lateral resolution of 161 nanometers and an axial resolution of 1.298 micrometers (measured in glass with refractive index n = 1.5), the system delivers exceptional 3D visualization of fine structures. Its outstanding refractive index sensitivity down to 10⁻⁴ allows for precise detection of even subtle material changes, making it ideal for applications requiring detailed analysis of transparent structures, thin film layers, and microfabricated components. This ensures unparalleled accuracy in industrial inspection and quality control.
Features
User benefits
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Non-Destructive 3D Imaging
Unlike conventional inspection tools that provide only surface-level information, HT-T1™ offers true three-dimensional imaging of internal structures completely non-destructively. No cutting, polishing, or physical contact is required. This allows repeated inspection of valuable or delicate samples without the risk of damage or contamination. Manufacturers can monitor product quality at any stage of production, confidently identifying internal defects or irregularities that may affect product performance. The ability to observe the full internal structure, layer by layer, ensures greater confidence in process control and long-term product reliability.
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Direct Laser Modification Analysis
Laser processes are increasingly used to modify transparent materials by changing their internal refractive index. However, these changes are often invisible to traditional inspection methods. HT-T1™ makes these hidden modifications visible by capturing detailed 3D refractive index maps. This allows engineers to directly observe how laser energy has altered the material—whether through densification, rarefaction, formation of microdefects, or even early stage cracking. With this clear feedback, laser process parameters can be fine-tuned for optimal performance, leading to more consistent manufacturing results and reduced process variability.
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Optimized Etching Process Control
In etching processes, controlling the exact shape, depth, and smoothness of features like vias and trenches is critical to device performance. HT-T1™ provides high-resolution 3D visualization of these structures after etching, accurately measuring parameters such as via taper, sidewall roughness, and etch completeness. By providing quantitative feedback not just on surface appearance but on internal geometry, the system allows engineers to adjust etching conditions with greater precision. This leads to improved uniformity across production batches, higher process yield, and more reliable downstream assembly.
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Enhanced AOI Inspection Support
Traditional Automated Optical Inspection (AOI) tools are effective at detecting surface defects but often miss internal problems that can lead to later failures. HT-T1™ complements AOI by revealing what conventional tools cannot see—such as subsurface voids, incomplete material removal, or hidden microcracks beneath the surface. By integrating HT-T1™ into the inspection workflow, manufacturers gain a deeper understanding of their process health, catch potential failures earlier, and reduce costly rework or scrap downstream. This deeper insight ultimately supports higher product reliability and customer satisfaction.
Applications
Configuration
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HT-T1™ Module
- HT imaging unit
- HT illumination unit
- TomoPilot interface with Host
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HT-T1™ Desktop
- HT imaging unit
- HT illumination unit
- Motorized Sample Stage
- TomoStudio T for Acqusition Control
- TomoAnalysis MI for Data viewing & Analysis